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 2SK3843
TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (U-MOSIII)
2SK3843
Switching Regulator, DC/DC Converter and Motor Drive Applications
Low drain-source ON resistance High forward transfer admittance : RDS (ON) = 2.7 m (typ.) : |Yfs| = 120 S (typ.) Unit: mm
Low leakage current : IDSS = 10 A (max) (VDS = 40 V) Enhancement mode : Vth = 1.5~3.0 V (VDS = 10 V, ID = 1 mA)
Maximum Ratings (Ta = 25C)
Characteristic Drain-source voltage Drain-gate voltage (RGS = 20 k) Gate-source voltage Drain current DC (Note 1) Symbol VDSS VDGR VGSS ID IDP PD EAS IAR EAR Tch Tstg Rating 40 40 20 75 300 125 542 75 12.5 150 -55~150 Unit V V V A A W mJ A mJ C C
Pulse (Note 1)
Drain power dissipation (Tc = 25C) Single-pulse avalanche energy (Note 2) Avalanche current Repetitive avalanche energy (Note 3) Channel temperature Storage temperature range
JEDEC JEITA TOSHIBA
SC-97 2-9F1B
Weight: 0.74 g (typ.)
Thermal Characteristics
Characteristic Thermal resistance, channel to case Symbol Rth (ch-c) Max 1.0 Unit C/W
1
4
Note 1: Ensure that the channel temperature does not exceed 150C. Note 2: VDD = 25 V, Tch = 25C (initial), L = 100 H, IAR = 75 A, RG = 25 Note 3: Repetitive rating: pulse width limited by maximum channel temperature. This transistor is an electrostatic-sensitive device. Handle with care.
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2SK3843
Electrical Characteristics (Ta = 25C)
Characteristic Gate leakage current Drain cutoff current Drain-source breakdown voltage Gate threshold voltage Drain-source ON resistance Forward transfer admittance Input capacitance Reverse transfer capacitance Output capacitance Rise time Symbol IGSS IDSS V (BR) DSS V (BR) DSX Vth RDS (ON) |Yfs| Ciss Crss Coss tr VGS Turn-on time Switching time Fall time tf toff Qg Qgs Qgd VDD 32 V, VGS = 10 V, ID = 75 A ton 4.7 10 V 0V ID = 38 A RL = 0.53 VOUT -- 40 -- ns -- 65 -- VDS = 10 V, VGS = 0 V, f = 1 MHz Test Condition VGS = 16 V, VDS = 0 V VDS = 40 V, VGS = 0 V ID = 10 mA, VGS = 0 V ID = 10 mA, VGS = -20 V VDS = 10 V, ID = 1 mA VGS = 4.5 V, ID = 38 A VGS = 10 V, ID = 38 A VDS = 10 V, ID = 38 A Min -- -- 40 15 1.5 -- -- 60 -- -- -- -- Typ. -- -- -- -- -- 4.3 2.7 120 11200 800 1350 12 Max 10 10 -- -- 3.0 8.0 3.5 -- -- -- -- -- pF Unit A A V V m S
VDD 20 V - Turn-off time Total gate charge (gate-source plus gate-drain) Gate-source charge Gate-drain ("Miller") Charge Duty < 1%, tw = 10 s = -- -- -- -- 260 210 150 60 -- -- -- -- nC
Source-Drain Ratings and Characteristics (Ta = 25C)
Characteristics Continuous drain reverse current (Note 1) Pulse drain reverse current (Note 1) Forward voltage (diode) Reverse recovery time Reverse recovery charge Symbol IDR IDRP VDSF trr Qrr Test Condition -- -- IDR1 = 75 A, VGS = 0 V IDR = 75 A, VGS = 0 V dIDR/dt = 30 A/s Min -- -- -- -- -- Typ. -- -- -- 100 120 Max 75 300 -1.5 -- -- Unit A A V ns nC
Marking
Part No. (or abbreviation code)
K3843
Lot No. A line indicates lead (Pb)-free package or lead (Pb)-free finish.
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ID - VDS
100 Common source Tc = 25C Pulse test 10 8 6 5 4.75 4.5 160 4.25 4 60 3.75 40 3.5 20 VGS = 3.25 V 0 0 200 10 8 6 5 4.75
ID - VDS
Common source Tc = 25C Pulse test
80
4.5
(A)
ID
ID
(A)
120
4.25
Drain current
Drain current
80
4
40
3.75 3.5 VGS = 3.25 V 0 1 2 3 4 5
0
0.1
0.2
0.3
0.4
0.5
Drain-source voltage
VDS
(V)
Drain-source voltage
VDS
(V)
ID - VGS
200
VDS - VGS
1.0
VDS (V)
Common source VDS = 10 V Pulse test
160
0.8
Common source Tc = 25C Pulse test
ID
(A)
120
80
100 Tc = -55C 25
Drain-source voltage
0.6
Drain current
0.4 ID = 75 A 38 19 0 0 4 8 12 16 20
40
0.2
0
0
2
4
6
8
10
Gate-source voltage
VGS
(V)
Gate-source voltage
VGS
(V)
Yfs - ID (S)
1000
RDS (ON) - ID
100 Common source Tc = 25C Pulse test
Yfs
Forward transfer admittance
100
Tc = -55C 25
100
Drain-source ON resistance RDS (ON) (m)
Common source VDS = 10 V Pulse test
10
VGS = 4.5 V
10
10
1 1
10
100
1000
1
1
10
100
1000
Drain current
ID
(A)
Drain current
ID
(A)
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2SK3843
RDS (ON) - Tc
10
IDR - VDS
1000 Common source Tc = 25C Pulse test 10 5 3 1 VGS = 0, -1 V
Drain-source ON resistance RDS (ON) (m)
8
IDR
6 VGS = 4.5 V 4 VGS = 10 V 2 ID = 75, 38, 19 A 19
(A) Drain reverse current
38 100 10 1
Common source Pulse test
0 -80
-40
0
40
80
120
160
0
-0.4
-0.8
-1.2
-1.6
-2.0
Case temperature
Tc
(C)
Drain-source voltage
VDS
(V)
C - VDS
100000 5
Vth - Tc Vth (V)
Common source VDS = 10 V ID = 1 mA Pulse test
(pF)
4
Gate threshold voltage
C
10000
Ciss
3
Capacitance
2
1000 Common source VGS = 0 V f = 1 MHz Tc = 25C 100 0.1 1 10
Coss Crss
1
100
0 -80
-40
0
40
80
120
160
Drain-source voltage
VDS
(V)
Case temperature
Tc
(C)
PD - Tc
150 40
Dynamic input/output characteristics VDS (V)
Common source ID = 75 A Tc = 25C Pulse test 16
(W)
30 16 20
12 VDD = 32 V
Drain power dissipation
Drain-source voltage
90
8
60
10
30
VGS
4
0 0
40
80
120
160
0 0
100
200
300
400
0 500
Case temperature
Tc
(C)
Total gate charge
Qg
(nC)
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Gate-source voltage
VGS
PD
120
VDS
8
(V)
2SK3843
rth - tw
10
Normalized transient thermal impedance rth (t)/Rth (ch-c)
1
Duty = 0.5 0.2 0.1
0.1
0.05 0.02 0.01
Single Pulse
PDM t T Duty = t/T Rth (ch-c) = 1.0C/W
0.01 10
100
1m
10 m
100 m
1
10
Pulse width
tw
(S)
Safe operating area
1000 1000
EAS - Tch
ID max (Pulse) * 1 ms * 100 ID max (Continuous) 10 ms *
EAS (mJ) Avalanche energy
800
600
ID
(A)
400
Drain current
10
DC operation Tc = 25C
200
0 25 1 * Single nonrepetitive pulse Tc = 25C
50
75
100
125
150
Channel temperature (initial) BVDSS IAR VDD Test circuit RG = 25 VDD = 25 V, L = 100 H
Tch (C)
Curves must be derated linearly with increase in temperature. 0.1 0.1 1 VDSS max 10 100
15 V 0V
Drain-source voltage
VDS
(V)
VDS
Wave form
AS =
1 B VDSS L I2 B 2 - VDD VDSS
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2SK3843
RESTRICTIONS ON PRODUCT USE
* The information contained herein is subject to change without notice.
20070701-EN
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations.
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